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Self-Powered Ultraviolet Photodetector with Superhigh Photoresponsivity (3.05 A/W) Based on the GaN/Sn:Ga<sub>2</sub>O<sub>3</sub> pn Junction

579

Citations

38

References

2018

Year

TLDR

Ultraviolet radiation affects human health, crop production, and building durability, yet current self‑powered UV photodetectors suffer from low photoelectric performance that limits practical use. The authors fabricated a GaN/Sn:Ga₂O₃ pn junction by depositing a Sn‑doped n‑type Ga₂O₃ thin film onto a p‑type GaN thick film to create a self‑powered UV photodetector. The device achieved a 3.05 A/W responsivity at 254 nm, a UV/visible rejection ratio of 5.9 × 10³, a detectivity of 1.69 × 10¹³ cm·Hz¹ᐟ²·W⁻¹, a dark current of 1.8 × 10⁻¹¹ A, an Iphoto/Idark ratio of ~10⁴, and an 18 ms response time, all enabled by rapid carrier separation in the junction’s high built‑in field.

Abstract

Ultraviolet (UV) radiation has a variety of impacts including the health of humans, the production of crops, and the lifetime of buildings. Based on the photovoltaic effect, self-powered UV photodetectors can measure and monitor UV radiation without any power consumption. However, the current low photoelectric performance of these detectors has hindered their practical use. In our study, a super-high-performance self-powered UV photodetector based on a GaN/Sn:Ga2O3 pn junction was generated by depositing a Sn-doped n-type Ga2O3 thin film onto a p-type GaN thick film. The responsivity at 254 nm reached up to 3.05 A/W without a power supply and had a high UV/visible rejection ratio of R254 nm/R400 nm = 5.9 × 103 and an ideal detectivity at 1.69 × 1013 cm·Hz1/2·W–1, which is well beyond the level of previous self-powered UV photodetectors. Moreover, our device also has a low dark current (1.8 × 10–11A), a high Iphoto/Idark ratio (∼104), and a fast photoresponse time of 18 ms without bias. These outstanding performance results are attributed to the rapid separation of photogenerated electron–hole pairs driven by a high built-in electric field in the interface depletion region of the GaN/Sn:Ga2O3 pn junction. Our results provide an improved and easy route to constructing high-performance self-powered UV photodetectors that can potentially replace traditional high-energy-consuming UV detection systems.

References

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