28 GHz 1.8 dB Insertion Loss SPDT Switch with 24 dB Isolation in 65 nm CMOS

Abstract

28 GHz SPDT switch has been designed and fabricated in 65 nm CMOS with deep N-well as a building block for beamforming-based 5 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</sup> generation mobile communication systems. The measured insertion loss is 1.8 dB at 28 GHz, and IIP3 is measured as 11.75 dBm. The input and output return losses are and , respectively.