Publication | Closed Access
2D Metal–Organic Framework Nanosheets with Time‐Dependent and Multilevel Memristive Switching
154
Citations
77
References
2018
Year
NanosheetEngineeringOrganic ElectronicsEmerging Memory TechnologyMultilevel Memristive SwitchingAbstract Metal–organic FrameworkChemistryData StorageElectronic DevicesNanoelectronicsHybrid MaterialsWeibull DistributionMaterials ScienceNanotechnologyOrganic SemiconductorElectrochemistryElectronic MaterialsNanomaterialsSemiconductor MemoryFunctional Materials
Metal–organic framework nanosheets, particularly 2D MOFs with highly accessible surface sites, are promising for sensing, electrochemical, catalytic, and data‑storage applications. The authors demonstrate a memory device by employing M‑TCPP as the resistive‑switching layer. The 2D M‑TCPP RRAMs exhibit time‑dependent bipolar switching governed by charge‑trapping‑assisted hopping, as confirmed by systematic voltage‑stress tests and AFM imaging. The devices show electroforming‑free bipolar switching with a 10³ on/off ratio, excellent retention and reliability, and support multilevel storage through compliance‑current tuning, underscoring their practical potential.
Abstract Metal–organic framework (MOF) nanosheets have attracted significant interests for sensing, electrochemical, and catalytic applications. Most significantly, 2D MOF with highly accessible sites on the surface is expected to be applicable in data storage. Here, the memory device is first demonstrated by employing M‐TCPP (TCPP: tetrakis(4‐carboxyphenyl)porphyrin, M: metal) as resistive switching (RS) layer. The as‐fabricated resistive random access memory (RRAM) devices exhibit a typical electroforming free bipolar switching characteristic with on/off ratio of 10 3 , superior retention, and reliability performance. Furthermore, the time‐dependent RS behaviors under constant voltage stress of 2D M‐TCPP–based RRAMs are systematically investigated. The properties of the percolated conducting paths are revealed by the Weibull distribution by collecting the measured turn‐on time. The multilevel information storage state can be gotten by setting a series of compliance current. The charge trapping assisted hopping is proposed as operation principle of the MOF‐based RRAMs which is further confirmed by atomic force microscopy at electrical modes. The research is highly relevant for practical operation of 2D MOF nanosheet–based RRAM, since the time widths, magnitudes of pulses, and multilevel‐data storage can be potentially set.
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