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EMA-based modeling of the surface potential and drain current of dual-material gate-all-around TFETs

Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringDual-material Gate-all-around TfetsNanoelectronicsElectronic EngineeringSurface PotentialApplied PhysicsBias Temperature InstabilityComputational ElectromagneticsEma-based ModelingMicroelectronicsElectromagnetic Compatibility