Dependence of hysteresis on the perovskite film thickness: inverse behavior between TiO₂ and PCBM in a normal planar structure

Abstract

The effect of perovskite film thickness on the current density (<italic>J</italic>)–voltage (<italic>V</italic>) hysteresis is investigated with a normal planar perovskite solar cell (PSC) having the FTO/ETL/MAPbI₃/spiro-MeOTAD/Au structure (ETL = electron transporting layer, MA = methylammonium, and spiro-MeOTAD = 2,2′,7,7′-tetrakis-(<italic>N</italic>,<italic>N</italic>-di-4-methoxyphenylamino)-9,9′-spirobifluorene).