Thin Solid Films · 2018 · 22 citations · 19 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSpectroscopyDevice CharacterizationSemiconductor Device MaterialsSemiconductor ReliabilitySemiconductor SurfacesSurface CharacterizationSurface DegradationCathodoluminescence MicroscopyGallium Nitride (Gan) Materials
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GaN Substrates for III-Nitride Devices
Tanya Paskova, Drew Hanser, K. R. Evans · Proceedings of the IEEE · 2009 · 162 citations · Full text