Generating flat-top beams with extended depth of focus

Abstract

Two approaches for generating flat-top beams (uniform intensity profile) with extended depth of focus are presented. One involves two diffractive optical elements (DOEs) and the other only a single DOE. The results indicate that the depth of focus of such beams strongly depends on the phase distribution at the output of the DOEs. By having uniform phase distribution, it is possible to generate flat-top beams with extended depth of focus.