Publication | Closed Access
A four-state kinetic model for the carrier-induced degradation in multicrystalline silicon: Introducing the reservoir state
82
Citations
41
References
2018
Year
Device ModelingEngineeringBias Temperature InstabilityApplied PhysicsReservoir StateSemiconductor Device FabricationFour-state Kinetic ModelSilicon On InsulatorMulticrystalline SiliconChemical KineticsSilicon Debugging
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