Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices - Concepedia

Concepedia

Publication | Closed Access

Defect Characterization, Imaging, and Control in Wide-Bandgap Semiconductors and Devices

10

Citations

38

References

2018

Year

L. J. Brillson, Geoffrey M. Foster, Jon W. Cox, William Ruane, Alexander Jarjour, Hantian Gao, Holger von Wenckstern, Marius Grundmann, B. Wang, D. C. Look,

Journal of Electronic Materials

SemiconductorsWide-bandgap SemiconductorElectrical EngineeringEngineeringDefect CharacterizationApplied PhysicsWide-bandgap SemiconductorsSemiconductor MaterialDefect FormationDefect Tolerance

References

	Year	Citations

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