Local Surface Modifications Investigated by Combining Scanning Electrochemical Microscopy and Surface‐Enhanced Raman Scattering

Abstract

Scanning electrochemical microscopy (SECM) is coupled with surface-enhanced Raman scattering (SERS) microscopy to characterize local surface modifications. SECM is utilized for the surface patterning of para-nitrothiophenol self-assembled monolayers (SAMs) in the direct mode of SECM with a subsequent readout of the chemical patterns by means of combined SECM-SERS. The SECM-SERS combination allows monitoring of local electrochemical processes and provides simultaneous complementary spectroscopic information. The reaction products upon SAM reduction, specifically p-aminothiophenol groups, are distinguished from the pristine SAM and locally ruptured areas.