Publication | Open Access
Franz-Keldysh effect in epitaxial ZnO thin films
13
Citations
33
References
2018
Year
Materials ScienceIi-vi SemiconductorEpitaxial GrowthEngineeringPhysicsOxide ElectronicsApplied PhysicsCondensed Matter PhysicsPhotoconductance SpectroscopyThinner FilmsThin FilmsFranz-keldysh EffectThin Film ProcessingSlow Relaxation Times
Photoconductance spectroscopy has been studied in epitaxial ZnO thin films with different thicknesses that range between 136 and 21 nm. We report a systematic decrease in photoconductivity and a red shift in band edge photoconductance spectra when the thickness is reduced. For thinner films, it is found that the effective energy gap value diminishes. By time dependent photoconductivity measurements, we found an enhanced contribution of the slow relaxation times for thicker films. These effects are interpreted in terms of a band-bending contribution where the Franz-Keldysh effect and the polarization of ZnO play a major role in thinner films.
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