Publication | Open Access
Large‐Scale Fabrication of MoS<sub>2</sub> Ribbons and Their Light‐Induced Electronic/Thermal Properties: Dichotomies in the Structural and Defect Engineering
32
Citations
46
References
2018
Year
EngineeringOptoelectronic DevicesTmd SemiconductorsThermal ConductivitySemiconductor NanostructuresSemiconductorsElectronic DevicesNanoelectronicsNanophotonicsMaterials EngineeringMaterials SciencePhotoluminescenceDefect EngineeringCrystalline DefectsPhysicsOptoelectronic MaterialsPhotonic MaterialsThermal TransportSemiconductor MaterialDefect FormationLayered MaterialTransition Metal ChalcogenidesLarge‐scale FabricationElectronic MaterialsApplied PhysicsOptoelectronics
Abstract Controlled design and patterning of layered transition metal dichalcogenides (TMDs) into specific dimensions and geometries hold great potential for next‐generation micro/nanoscale electronic applications. Herein, the large‐scale fabrication of MoS 2 ribbons with widths ranging from micro‐ to nanoscale is reported. Their unique electric and thermal properties introduced by the shape change and defect creation are also demonstrated, with particular focus on the performance associated with light–matter interactions. The theoretical calculation indicates significantly increased absorption and scattering efficiency of the MoS 2 ribbons with decreasing width. As a result, enhanced photocarrier generation ability is detected on their phototransistors with defect‐modulated light‐response behavior. The light‐induced thermal transport properties of the MoS 2 ribbons are further studied. A decreased thermal conductivity is observed on narrower ribbons, attributed to the defects created during fabrication. It is also found that the effect of phonon scattering at ribbon edges on their thermal conductivity is insignificant, and the thermal transport has no obvious dependence on the ribbon direction at such width scale. This study evaluates the prospects for designing and fabricating TMD semiconductors with specific geometries for future optoelectronic applications.
| Year | Citations | |
|---|---|---|
Page 1
Page 1