A Study of Exfoliated Molybdenum Disulfide (MoS<sub>2</sub>) Based on Raman and Photoluminescence Spectroscopy

Abstract

In this study, We demonstrate mono and few layers MoS 2 samples on the SiO 2 (270nm)/Si substrate from bulk MoS 2 crystal by micromechanical exfoliation technique. We have systematically studied Atomic Force Microscopy, Raman and PL properties of mono and few layer MoS 2 on the SiO 2 (270nm)/Si substrate. First, we find that the number of layer values dependent the Raman and PL emission. First, Raman intensity area ratio of the MoS 2 E 1 2g , A 1g and 2LA modes to that area of the Si substrate increased linear with increasing number of layers MoS 2 . Second, Normalized PL intensity area of the (A) peak decreased linear with increasing number of layers MoS 2 . The value of those graphs is a method to understand the number of layers the exfoliated MoS 2 .