What You Corrupt Is Not What You Crash: Challenges in Fuzzing Embedded Devices

Abstract

As networked embedded systems are becoming more ubiquitous, their security is becoming critical to our daily life. While manual or automated large scale analysis of those systems regularly uncover new vulnerabilities, the way those systems are analyzed follows often the same approaches used on desktop systems. More specifically, traditional testing approaches relies on observable crashes of a program, and binary instrumentation techniques are used to improve the detection of those faulty states.