Publication | Open Access
Finite element modeling to analyze TEER values across silicon nanomembranes
25
Citations
38
References
2018
Year
Device ModelingNanoscale SystemEngineeringPhysicsNanotechnologyNanoelectronicsNumerical SimulationApplied PhysicsNanoscale ModelingTeer ValuesSemiconductor Device FabricationElectronic PackagingSilicon On InsulatorMicroelectronics
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