AIP Advances · 2017 · 11 citations · 6 references
Natural SciencesMaterials SciencePhysicsMagnetic MaterialsMaterials ChemistryThin FilmsAntiferromagnetismFerromagnetic MaterialsFerromagnetismMagnetic AnisotropyMagnetic OxidesMagnetic Thin FilmsDeposition RateEpitaxial Antiferromagnetic FilmsEpitaxial Magnetic FilmsEpitaxial Thin FilmsMagneto-optical PropertiesMagnetron SputteringPerpendicular Magnetic AnisotropyTetragonal Distortion
Thin films of antiperovskite Mn3GaN1-x were grown on MgO (001) substrates by reactive magnetron sputtering, and their structural, magnetic, and magneto-optical properties were systematically investigated. It was found that the combination of the deposition rate and the N2 gas partial pressure could produce epitaxial films with a wide range of N composition (N-deficiency) and resulting c/a values (0.93 - 1.0). While the films with c/a = 0.992 - 1.0 were antiferromagnetic, the films with c/a = 0.93 - 0.989 showed perpendicular magnetic anisotropy (PMA) with the maximum PMA energy up to 1.5×106 erg/cm3. Systematic dependences of the energy spectra of the polar Kerr signals on the c/a ratio were observed, and the Kerr ellipticity was as large as 2.4 deg. at 1.9 eV for perpendicularly magnetized ferromagnetic thin films with c/a = 0.975. These results highlight that the tetragonal distortion plays an important role in magnetic and magneto-optical properties of Mn3GaN1-x thin films.
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Diffraction neutronique de Mn3GaN
E.F. Bertaut, D. Fruchart, J. P. Bouchaud et al. · Solid State Communications · 1968 · 114 citations