Towards Gotthard-II: development of a silicon microstrip detector for the European X-ray Free-Electron Laser

Abstract

Gotthard-II is a 1-D microstrip detector specifically developed for the\nEuropean X-ray Free-Electron Laser. It will not only be used in energy\ndispersive experiments but also as a beam diagnostic tool with additional logic\nto generate veto signals for the other 2-D detectors. Gotthard-II makes use of\na silicon microstrip sensor with a pitch of either 50 {\\mu}m or 25 {\\mu}m and\nwith 1280 or 2560 channels wire-bonded to adaptive gain switching readout\nchips. Built-in analog-to-digital converters and digital memories will be\nimplemented in the readout chip for a continuous conversion and storage of\nframes for all bunches in the bunch train. The performance of analogue\nfront-end prototypes of Gotthard has been investigated in this work. The\nresults in terms of noise, conversionngain, dynamic range, obtained by means of\ninfrared laser and X-rays, will be shown. In particular, the effects of the\nstrip-to-strip coupling are studied in detail and it is found that the\nreduction of the coupling effects is one of the key factors for the development\nof the analogue front-end of Gotthard-II.\n