2017 · 11 citations · 3 references
Wearable SystemEngineeringMeasurementWearable TechnologyEducationWearable ComputerStressInstrumentationElectrical EngineeringWearable ElectronicsComputer EngineeringTest IcLevel SensingBioelectronicsElectrophysiologyTechnologyEsd Stress CurrentsTransient Event DetectionWearable Sensor
Currents induced on an I/O of a human wearable device IC are predicted using a test IC as a wearable device capable of transient event detection and level sensing. ESD on this pseudo wearable device using the test IC is characterized for different test scenarios and compared to the prediction.
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On-Chip sensors to measure level of transient events
Abhishek Patnaik, Mihir Vimal Suchak, Ramu Seva et al. · 2017 · 11 citations