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Reduction of deoxynivalenol (DON) contamination by improved fungicide use in wheat. Part 1. Dependence on epidemic severity and resistance level in small plot tests with artificial inoculation.

EngineeringAllergyPesticide-residue AnalysisCrop ProtectionAgricultural EconomicsPlant ProtectionSmall Plot TestsPlant PathologyPest ManagementResistance LevelIntegrated Plant ProtectionMedicineAntimicrobial ResistanceEpidemic Severity