Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography - Concepedia

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Mapping of Lattice Strain in 4H-SiC Crystals by Synchrotron Double-Crystal X-ray Topography

31

Citations

10

References

2017

Year

Jianqiu Guo, Yu Yang, Balaji Raghothamachar, Michael Dudley, Stanislav Stoupin

Journal of Electronic Materials

Materials ScienceX-ray SpectroscopyEngineeringLattice StrainX-ray DiffractionApplied PhysicsCarbideDefect FormationStructural Ceramic4H-sic CrystalsCrystallographyMicrostructure

References

	Year	Citations

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