Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques · 2017 · 26 citations · 7 references
Natural SciencesMaterials SciencePhysicsNanomaterialsNanotechnologySurface ScienceNanoscale MaterialsRadiation Damage In MaterialsSurface CrystallographySurface PhysicsThin Film Surface MorphologyThin-film Deposition
The effect of preliminary low-energy (~1 keV) and low-dose (~10 12 –10 14 cm –2 ) ion bombardment on the initial stages of growth of Si films on a CaF 2 /Si surface is investigated. Ordered nanocrystal phases (thickness less than 5–6 monolayers) and homogeneous epitaxial nanofilms (thickness more than 8–10 monolayers) of silicon are shown to be formed after annealing.
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M. Watanabe, Yoshifumi Iketani Yoshifumi Iketani, Masahiro Asada · Japanese Journal of Applied Physics · 2000 · 62 citations
Structure Determination of Surface Magic Clusters
Hao Chang, M. Y. Lai, Jiuyan Wei et al. · Physical Review Letters · 2004 · 56 citations