Publication | Closed Access
Evidence of an identical firing-activated carrier-induced defect in monocrystalline and multicrystalline silicon
148
Citations
59
References
2017
Year
Electrical EngineeringEngineeringApplied PhysicsDefect FormationSemiconductor Device FabricationSilicon On InsulatorDefect ToleranceMulticrystalline SiliconSilicon Debugging
| Year | Citations | |
|---|---|---|
Page 1
Page 1