Microscopy and Microanalysis · 2017 · 11 citations · 3 references
EngineeringMaterials EngineeringMaterials ScienceElemental AnalysisMaterials ChemistryMetallurgyElectron MicroscopyIon ImplantationRadiation Damage In MaterialsAmorphous MetalsAmorphous RegionsBeam DamageSample Damage MechanismsSample Irradiation
P Nowakowski, CS Bonifacio, MJ Campin, ML Ray, PE Fischione; Accurate Removal of Implanted Gallium and Amorphous Damage from TEM Specimens after Focused Io
3
TEM Sample Preparation and FIB-Induced Damage
Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino et al. · MRS Bulletin · 2007 · 873 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +6