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Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films

Materials ScienceSurface CharacterizationOptical MaterialsEngineeringOptical PropertiesSurface ScienceApplied PhysicsSurface EngineeringFractal ModelsAg–cu Thin FilmsThin Film Process TechnologyThin FilmsThin Film ProcessingMie Theory