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High-speed high-accuracy three-dimensional shape measurement using digital binary defocusing method versus sinusoidal method
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2017
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EngineeringMeasurementOptic DesignMechanical EngineeringOptical TestingShape AnalysisComputer-aided DesignDigital HolographyCalibrationDigital Image CorrelationGeometrical AccuracyInstrumentationComputational GeometryGeometric ModelingDigital Light ProcessingTime MetrologySinusoidal PatternsFreeform Optic3D PrintingNatural SciencesAvailable Inexpensive Projector3D ScanningOptical System Analysis3D Imaging
This paper presents our research findings on high-speed high-accuracy three-dimensional shape measurement using digital light processing (DLP) technologies. In particular, we compare two different sinusoidal fringe generation techniques using the DLP projection devices: direct projection of computer-generated 8-bit sinusoidal patterns (a.k.a., the sinusoidal method), and the creation of sinusoidal patterns by defocusing binary patterns (a.k.a., the binary defocusing method). This paper mainly examines their performance on high-accuracy measurement applications under precisely controlled settings. Two different projection systems were tested in this study: a commercially available inexpensive projector and the DLP development kit. Experimental results demonstrated that the binary defocusing method always outperforms the sinusoidal method if a sufficient number of phase-shifted fringe patterns can be used.