Dalton Transactions · 2017 · 20 citations · 31 references
NbSCl<sub>3</sub> was obtained via reaction of NbCl<sub>5</sub> with S(SiMe<sub>3</sub>)<sub>2</sub> in anhydrous CH<sub>2</sub>Cl<sub>2</sub>, whilst in MeCN solution the same reaction gives [NbSCl<sub>3</sub>(MeCN)<sub>2</sub>]. [NbSeCl<sub>3</sub>(MeCN)<sub>2</sub>] was obtained similarly from NbCl<sub>5</sub> with Se(SiMe<sub>3</sub>)<sub>2</sub>. The chalcogenoether complexes, [NbSCl<sub>3</sub>(ER<sub>2</sub>)] (E = S: R = Me, <sup>n</sup>Bu; E = Se: R = <sup>n</sup>Bu), were obtained from reaction of NbCl<sub>5</sub>, ER<sub>2</sub> and S(SiMe<sub>3</sub>)<sub>2</sub> in CH<sub>2</sub>Cl<sub>2</sub>. The structure of the [Nb<sub>2</sub>S<sub>2</sub>Cl<sub>6</sub>(SMe<sub>2</sub>)<sub>2</sub>] reveals a Cl-bridged dimer with the SMe<sub>2</sub> ligands disposed syn. The Cl bridges are highly asymmetric, with the long Nb-Cl bond trans Nb[double bond, length as m-dash]S. The complexes, [NbSCl<sub>3</sub>(L-L)] (L-L = MeSCH<sub>2</sub>CH<sub>2</sub>SMe, MeS(CH<sub>2</sub>)<sub>3</sub>SMe, <sup>i</sup>PrSCH<sub>2</sub>CH<sub>2</sub>S<sup>i</sup>Pr, MeSe(CH<sub>2</sub>)<sub>3</sub>SeMe and <sup>n</sup>BuS(CH<sub>2</sub>)<sub>3</sub>S<sup>n</sup>Bu), were obtained from reaction of L-L with preformed [NbSCl<sub>3</sub>(MeCN)<sub>2</sub>]. The structures of the Me-substituted complexes reveal distorted octahedral monomers with the neutral ligands trans to S/Cl. Solution <sup>1</sup>H and <sup>77</sup>Se{<sup>1</sup>H} NMR data showed that the neutral ligands are partially dissociated and undergoing fast exchange at ambient temperatures in CH<sub>2</sub>Cl<sub>2</sub> solution, consistent with weak Lewis acidity for NbSCl<sub>3</sub>. The complexes containing <sup>n</sup>Bu-substituted ligands have been used as single source precursors for low pressure chemical vapour deposition (CVD) of 3R-NbS<sub>2</sub> thin films. 2H-NbSe<sub>2</sub> thin films were also obtained via low pressure CVD using [NbSe<sub>2</sub>Cl<sub>3</sub>(Se<sup>n</sup>Bu<sub>2</sub>)]. The thin films were characterised by grazing incidence and in-plane XRD, pole figure analysis, scanning electron microscopy and energy dispersive X-ray analysis.
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Quanjun Xiang, Jiaguo Yu, Mietek Jaroniec · Journal of the American Chemical Society · 2012 · 2.3K citations
Materials Science, Chemical Engineering, Graphene Components +15