Sensitivity Distribution of CCERT Sensor Under Different Excitation Patterns

Abstract

This paper focuses on the study of sensitivity distribution of the capacitively coupled electrical resistance tomography (CCERT) and the influences of excitation patterns on sensitivity distributions. The sensitivity distributions of a 12-electrode CCERT sensor under three excitation patterns (the one-electrode excitation pattern, the three-electrode excitation pattern, and the five-electrode excitation pattern) are investigated and compared. The simulation study was implemented by the COMSOL Multiphysics FEM simulation software and MATLAB. The research results show that there is no negative region in the sensitivity distributions of the CCERT sensor and all the sensitivity distributions are not uniform. The research results also indicate that as the number of excitation electrodes increases, the sensitivity distributions have higher average sensitivity and better distribution uniformity.