Probing electrochemistry at the nanoscale: in situ TEM and STM characterizations of conducting filaments in memristive devices - Concepedia

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Probing electrochemistry at the nanoscale: in situ TEM and STM characterizations of conducting filaments in memristive devices

37

Citations

89

References

2017

Year

Yuchao Yang, Yasuo Takahashi, Atsushi Tsurumaki‐Fukuchi, Masashi Arita, Marco Moors, Mark Buckwell, Adnan Mehonić, Anthony J. Kenyon

Journal of Electroceramics

Materials ScienceEngineeringMemristive DevicesNanotechnologyApplied PhysicsMemory DeviceSemiconductor MemoryStm CharacterizationsSitu TemPhase Change MemoryElectrochemistry

References

	Year	Citations

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