Temperature dependent study of Fin-FET drain current through optimization of controlling gate parameters and dielectric material - Concepedia

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Temperature dependent study of Fin-FET drain current through optimization of controlling gate parameters and dielectric material

24

Citations

15

References

2017

Year

Rinku Rani Das, Santanu Maity, Deboraj Muchahary, Chandan Tilak Bhunia

Superlattices and Microstructures

Device ModelingElectrical EngineeringEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityApplied PhysicsFin-fet DrainHeat TransferGate ParametersMicroelectronicsTemperature Dependent StudySemiconductor Device

References

	Year	Citations

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