IEEE Transactions on Electromagnetic Compatibility · 2017 · 25 citations · 25 references
Natural SciencesElectrical EngineeringMaterials ScienceOptical MaterialsPropagationThin FilmsDielectricsElectrical ConductivityShielding MaterialsThin Film Electrical PropertiesThin-film DepositionThin-film MaterialsOptical TransmissionOptical Transmission SystemsSheet ResistanceShielding Effectiveness EvaluationShielding EfficiencyShielding In Thin FilmsThin Film ImpedanceThin-film Conductors
This paper addresses the combined theoretical assessment of shielding effectiveness, optical transmission, and sheet resistance of conductors in a thin-film technology. The synthesized model is based on the well-known transmission line approach to describe the wave propagation through multilayer structures consisting in thin films deposited on dielectric substrates. In this study, a complete model synthesis is presented, combining the estimation of the above parameters simultaneously. This model includes corrections of a few errors and inaccuracies regarding the computation of thin-film impedances, thereby clarifying the current literature survey. Additionally achieving the best tradeoff between shielding effectiveness and optical transmission is facilitated with the proposed model. Experimental results from continuous and mesh conducting films deposited on glass substrates have been compared with the theoretical ones, thereby validating the present model.
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