Spectroscopic ellipsometry study of spin coated P(VDF-TrFE-CTFE) thin films and P(VDF-TrFE-CTFE)/PMMA blends - Concepedia

Concepedia

Publication | Closed Access

Spectroscopic ellipsometry study of spin coated P(VDF-TrFE-CTFE) thin films and P(VDF-TrFE-CTFE)/PMMA blends

12

Citations

14

References

2017

Year

M. Ben-David, Leeya Engel, Yosi Shacham‐Diamand

Microelectronic Engineering

Materials ScienceEngineeringSurface ScienceApplied PhysicsMagnetic ResonanceSpectroscopic Ellipsometry StudyThin Film Process TechnologyThin FilmsSpintronic MaterialThin Film Processing

References

	Year	Citations

Page 1