Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy

U. Bangert, Andrew Stewart, Eoghan O’Connell, Eileen Courtney, Quentin M. Ramasse, Demie Kepaptsoglou, Julian Alexander Amani, Jhih‐Sian Tu

Ultramicroscopy · 2016 · 38 citations · 27 references

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