Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy - Concepedia

Concepedia

Publication | Closed Access

Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy

36

Citations

27

References

2016

Year

U. Bangert, Andrew Stewart, Eoghan O’Connell, Eileen Courtney, Quentin M. Ramasse, Demie Kepaptsoglou, Julian Alexander Amani, Jhih‐Sian Tu

Ultramicroscopy

Materials ScienceIon ImplantationEngineeringElectron MicroscopyMicroscopyNanotechnologyApplied Physics2-D MaterialsElectron MicroscopeIon BeamIon-beam Modification

References

	Year	Citations

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