Publication | Closed Access
Defects of clean graphene and sputtered graphite surfaces characterized by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy
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Citations
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References
2016
Year
Materials ScienceClean GrapheneGraphene NanomeshesEngineeringNanomaterialsSurface ScienceApplied PhysicsX-ray Photoelectron SpectroscopyGraphite SurfacesGrapheneGraphene Nanoribbon
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