Publication | Closed Access
Advanced large-signal modeling of GaN-HEMTs
10
Citations
9
References
2003
Year
Unknown Venue
Device ModelingElectrical EngineeringThermal Sub-circuitEngineeringRf SemiconductorAdvanced Large-signal ModelingNanoelectronicsApplied PhysicsAluminum Gallium NitrideNon-linear ModelingGan Power DeviceRf ConditionsPower ElectronicsHeat TransferMicroelectronicsCategoryiii-v Semiconductor
For improved non-linear modeling of AlGaN/GaN high electron mobility transistors, a large-signal model originally developed for GaAs-based devices has been extended by introduction of a thermal sub-circuit to account for self-heating. Thereby, DC output characteristics which typically show negative output conductance at a high dissipating power level are well reproduced. Since self-heating also effects the transconductance, which is related to S/sub 21/ at RF conditions, the comparison of broadband S-parameter simulations and measurements revealed significant improvement when using the extended model. First experimental and theoretical investigations on the transient behavior at pulsed conditions are finally presented.
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