Operational and reliability comparison of discrete-storage nonvolatile memories: advantages of single- and double-layer metal nanocrystals

Abstract

Aggressive scaling of EEPROM to below 1,000 nm/sup 2/ bit area will enable more applications as low-power mobile systems. We have performed a critical comparison on discrete charge storage nodes, and established the advantages of metal nanocrystals in terms of programming/retention design trade-off and long-term endurance.