Publication | Closed Access
Applying wedge shape model for calculating both film thickness and optical constants of Se S Zn films with high precision for optoelectronic devices
20
Citations
32
References
2016
Year
Materials ScienceWedge Shape ModelIi-vi SemiconductorOptical MaterialsElectronic DevicesEngineeringPhysicsOptical PropertiesFilm ThicknessApplied PhysicsSemiconductor MaterialOptoelectronic DevicesHigh PrecisionThin FilmsPulsed Laser DepositionOptoelectronicsThin Film Processing
| Year | Citations | |
|---|---|---|
Page 1
Page 1