Characterization of thermally controlled quartz crystal microbalances

Abstract

This work deals with temperature characterization of embedded resistors deposited on CAM (Contamination Assessment Microbalance), quartz crystal microbalances developed for thermogravimetric analyses in Space. Designed instrument is innovative thanks to the deposited resistors that allow quartz crystal thermal control by direct heating of the sensing area. Characterization of the deposited materials is of primary importance to provide accurate temperature measurement and retrieve reliable results from the instrument thermogravimetric analyses. Linearity of the Cr-Au material has been verified between -20 and 100 °C and confirmed at cryogenic temperatures. Characterization has been complemented with thermal mapping of an instrument mockup in air. Agreement between reading of the deposited sensor and IR thermography of the crystal has been achieved and the measured thermal map allowed validation of the instrument design.