Publication | Closed Access
6.7-nm Emission from Gd and Tb Plasmas over a Broad Range of Irradiation Parameters Using a Single Laser
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Citations
26
References
2016
Year
EngineeringElectron-beam LithographyConversion EfficiencyLaser-plasma InteractionIntegrated CircuitsHigh-power LasersWafer Scale ProcessingSingle LaserBeam LithographyTb PlasmasPlasma PhotonicsComputer ChipPhotonicsElectrical EngineeringPhysicsRelativistic Laser-matter InteractionComputer EngineeringMicroelectronics6.7-Nm EmissionLaser-induced BreakdownApplied PhysicsOptoelectronics
As we follow Moore's Law and pack more and more components onto each computer chip, we must extend the limits of manufacturing. Looking ahead, efficient sources of light at a wavelength around 6.7 nm are needed for beyond-extreme-ultraviolet (BEUV) lithography, to create integrated circuits beyond the 7-nm logic node. This study measures and models plasmas of Gd and Tb, prepared using a single laser tuned over a broad range of parameters. These plasmas do emit at the desired wavelength, and calculations indicate that a conversion efficiency of 6% could ultimately be realized.
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