Publication | Open Access

Designing multi-label classifiers that maximize F measures: State of the art

Classification MethodEngineeringInformation RetrievalData ScienceData MiningPattern RecognitionMachine LearningPredictive AnalyticsF MeasuresKnowledge DiscoveryMultiple Classifier SystemAutomatic ClassificationIntelligent ClassificationComputer ScienceMulti-label ClassifiersClassifier SystemStatistics