Publication | Closed Access
Electrical Properties of Epitaxial Thin Films of Oxyhydrides ATiO<sub>3–<i>x</i></sub>H<sub><i>x</i></sub> (A = Ba and Sr)
49
Citations
34
References
2015
Year
EngineeringHalide PerovskitesElectronic PropertiesElectrical PropertiesQuantum MaterialsEpitaxial GrowthMaterials ScienceMaterials EngineeringOxide HeterostructuresPerovskite Oxyhydrides Atio3–xhxOxide ElectronicsPerovskite MaterialsElectron TransportSemiconductor MaterialElectrical PropertyElectronic MaterialsPerovskite Solar CellSurface ScienceApplied PhysicsCondensed Matter PhysicsEpitaxial Thin FilmsThin Films
We have studied electronic properties of perovskite oxyhydrides ATiO3–xHx (A = Ba, Sr). Epitaxial thin films of ATiO3–xHx with various hydride compositions, up to x = 0.58 for Ba and x = 0.45 for Sr, are prepared by the low-temperature CaH2 reduction of the corresponding oxide films deposited on (LaAlO3)0.3(SrAl0.5Ta0.5O3)0.7 (LSAT) substrates by pulsed laser deposition. Resistivity measurements for A = Sr show a metallic phase over a wide range of H– composition, implying a substantial stabilization of H 1s orbitals that should be distributed over O 2p orbitals. On the other hand, for A = Ba, a semiconducting behavior is seen up to ∼5–8% of H– substitution. Interestingly, a similar contrasting behavior is observed in a Nb-substituted BaTiO3 and SrTiO3, which suggests that a local cation–off centering in lightly doped Ba films creates in-gap states in the band structure (as opposed to the Sr films), hindering the electron transport.
| Year | Citations | |
|---|---|---|
Page 1
Page 1