IEEE Journal of Solid-State Circuits · 2016 · 53 citations · 25 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsLow-power DesignSensorsAnalog Integrated CircuitsCmos Circuit DesignDigital Image ProcessingDynamic Power ReductionImage ProcessingMixed-signal Integrated Circuit DesignAnalog-digital ConversionAnalog-to-digital ConversionAnalog-to-digital ConvertersCmos Image SensorsDecision CyclesLow-power Cmos DesignLow-power SensorsPower Consumption
This paper presents a power-saving readout scheme for CMOS image sensors (CISs) that utilizes the image properties. The proposed delta-readout (A-readout) scheme reads the signal difference between two pixels located next to each other (Apixel) by utilizing the most significant bits (MSBs) information of the previous pixel. By effectively reducing the dynamic range of the signal, compensated by the A-window checking, the proposed A-readout scheme can reduce the effective number of decision cycles in a successive-approximation register (SAR) analog-to-digital converter (ADC) and reduce the power consumption while preserving the ADC performance. A prototype QQVGA CIS with ten 10-bit SAR ADCs in a multi-column-parallel (MCP) configuration was fabricated in a 0.18 μm 1P4M CIS process with a 4.4 μm pixel pitch, where each single ADC occupies an area of 70 μm × 500 μm. The measurement results of the implemented prototype CIS showed a maximum power-saving of 26% with a figure-of-merit (FoM) for ADC of 15 fJ/conversion-step.
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