Publication | Closed Access
Full-atomistic nanoscale modeling of the ion beam sputtering deposition of SiO2 thin films
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Citations
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References
2016
Year
Materials ScienceEngineeringPhysicsNanotechnologySurface ScienceApplied PhysicsIon BeamChemical Vapor DepositionThin FilmsChemical DepositionMicroelectronicsFull-atomistic Nanoscale ModelingSilicon On InsulatorThin Film ProcessingSio2 Thin Films
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