Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis - Concepedia

Concepedia

Publication | Closed Access

Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis

44

Citations

13

References

2013

Year

Ştefan Ţălu, Alaa J. Ghazai, Sebastian Stach, Mohamed Ibrahim Abu Hassan, Z. Hassan

Journal of Materials Science Materials in Electronics

Materials ScienceSurface CharacterizationEngineeringSurface RoughnessSurface AnalysisSurface ScienceApplied PhysicsThin FilmsFractal AnalysisPt Schottky ContactsThin Film ProcessingMicrostructure

References

	Year	Citations

Page 1