Concepedia

Publication | Closed Access

Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy

DOI

37

Citations

26

References

2016

Year

Wei Qiu, Cui-Li Cheng, Renrong Liang, Chunwang Zhao, Zhenkun Lei, Yu-Cheng Zhao, Lulu Ma, Jun Xu, Huajun Fang, Yilan Kang
Acta Mechanica Sinica

References

YearCitations

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