on the electronic transport and optical properties of ZnTe thin films

Abstract

ZnTe thin films (d = 0.12 –1.80 m) were deposited onto glass substrates by the quasi-closed volume technique under vacuum. The structure analysis of the film was performed by X-ray diffraction (XRD) technique and atomic force microscopy (AFM). The films are polycrystalline and have a würtzite (hexagonal) structure. It was experimentally established that films with stable structure can be obtained if they, are subjected to a heat treatment. The spectral dependences of absorption coefficient were calculated in the range 400- 1400 nm, from transmission spectra. The influence of heat treatment on the shape of the transmission and absorption spectra was studied for samples with different thickness. Optical gap, calculated from the absorption spectra is situated in the range 1.70 eV – 2.40 eV.