Publication | Closed Access
Structural, morphological and spectroscopic ellipsometry studies on sputter deposited Sb2S3 thin films
66
Citations
35
References
2016
Year
Materials ScienceSurface CharacterizationMaterial AnalysisEngineeringPhysicsOptical PropertiesSurface ScienceApplied PhysicsSpectroscopic Ellipsometry StudiesThin FilmsEpitaxial GrowthThin Film ProcessingSb2s3 Thin Films
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