Journal of Optics · 2016 · 35 citations · 34 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationNanomaterialsNanotechnologyNanomaterial CharacterizationNanomechanicsNanowiresStrain EngineeringX-ray DiffractionX-ray OpticsHigh-resolution Strain MeasurementIndium PhosphideNanowire CharacterizationOperando CharacterizationOperando MicroscopyStrain Field MeasurementStrain Field ReconstructionStrain In Nanostructures
Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire, Dzhigaev, D, Shabalin, A, Stankevič, T, Lorenz, U, Kurta, R P, Seiboth, F, Wallentin, J, Singer, A, Lazarev, S, Yefanov, O M, Borgström, M, Strikhanov, M N, Samuelson, L, Falkenberg, G, Schroer, C G, Mikkelsen, A, Feidenhans‘l, R, Vartanyants, I A
34
Phase retrieval algorithms: a comparison
James R. Fienup · Applied Optics · 1982 · 5.6K citations
Nanowire transistors without junctions
Jean-Pierre Colinge, Chi‐Woo Lee, Aryan Afzalian et al. · Nature Nanotechnology · 2010 · 2.4K citations
Ruoxue Yan, Daniel J. Gargas, Peidong Yang · Nature Photonics · 2009 · 1.6K citations
Natural Sciences, Materials Engineering, Materials Science +17