Publication | Open Access
Direct optical band gap measurement in polycrystalline semiconductors: A critical look at the Tauc method
434
Citations
35
References
2016
Year
Materials SciencePhotonicsSemiconductorsOptical MaterialsEngineeringIi-vi SemiconductorPhysicsOptical PropertiesOptical TestingApplied PhysicsSemiconductor MaterialPolycrystalline SemiconductorsCritical LookOptoelectronicsTauc MethodCompound Semiconductor
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