Publication | Closed Access

Time-of-flight secondary ion mass spectrometry (ToF-SIMS)-based analysis and imaging of polyethylene microplastics formation during sea surf simulation

MicroplasticsChemical EngineeringSea Surf SimulationEngineeringEnvironmental EngineeringMass SpectrometryMarine PollutionPolyethylene Microplastics FormationMarine ChemistryAnalytical ChemistryPlastic PollutionSurfactant Solution