IEEE Journal of Selected Topics in Quantum Electronics · 2015 · 29 citations · 21 references
EngineeringElectrical EngineeringPhysicsOpticsOptoelectronicsPhotonicsOptical WaveguidesRefractive IndexSemiconductor HeterostructuresSilicon PhotonicsBandwidthReflectivitySilicon WaveguidesSilicon-on-insulator TechnologyWaveguide DesignWaveguide Gratings
A complementary metal-oxide-semiconductor-compatible cladding-modulated grating design with weakly coupled corrugations on long side waveguides is demonstrated on the silicon-on-insulator platform to allow not only a narrowband reflection (Δλ = 0.217 nm) but also an insensitive Bragg wavelength to the grating width change (Δλ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">B</sub> /ΔW <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">g</sub> = 0.0167). Fine-tuning of the reflection bandwidth is also possible by simply adjusting the grating width (Δλ/ΔW <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">g</sub> = 0.012). With a 30-nm grating width, as-fabricated cladding-modulated gratings are demonstrated to provide a close-to-unity peak reflectivity, a 0.6 nm reflection bandwidth and a 21.4 dB extinction ratio. The additional propagation loss arising from the introduction of sidewall corrugations is characterized to be only 0.1 dB. Such a superior performance is difficult to be reproduced by simply using stripor slab-type grating counterparts.
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Narrow-band waveguide Bragg gratings on SOI wafers with CMOS-compatible fabrication process
Xu Wang, Wei Shi, Han Yun et al. · Optics Express · 2012 · 233 citations · Full text